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  • Introduction to Analytical Electron Microscopy
    Introduction to Analytical Electron Microscopy

    The birth of analytical electron microscopy (AEM) is somewhat obscure.Was it the recognition of the power and the development of STEM that signaled its birth?Was AEM born with the attachment of a crystal spectrometer to an otherwise conventional TEM? Or was it born earlier with the first analysis of electron loss spectra?It's not likely that any of these developments alone would have been sufficient and there have been many others (microdiffraction, EDS, microbeam fabrication, etc.) that could equally lay claim to being critical to the establishment of true AEM.It is probably more accurate to simply ascribe the present rapid development to the obvious: a combination of ideas whose time has come.Perhaps it is difficult to trace the birth of AEM simply because it remains a point of contention to even define its true scope.For example, the topics in this book, even though very broad, are still far from a complete description of what many call AEM.When electron beams interact with a solid it is well-known that a bewildering number of possible interactions follow.Analytical electron microscopy attempts to take full qualitative and quantitative advantage of as many of these interactions as possible while still preserving the capability of high resolution imaging.Although we restrict ourselves here to electron transparent films, much of what is described applies to thick specimens as well.Not surprisingly, signals from all possible interactions cannot yet (and probably never will) be attained simultaneously under optimum conditions.

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  • Transmission Electron Microscopy : Diffraction, Imaging, and Spectrometry
    Transmission Electron Microscopy : Diffraction, Imaging, and Spectrometry

    This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter.The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text.World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material.The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid.As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments.Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials ScienceTopics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging.The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

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  • Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists
    Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

    The structure–property relationship is a key topic in materials science and engineering.To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics.Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures. Introduces fundamentals of crystallography Covers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methods Describes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrasts Discusses applications of HRTEM in materials research Explains concepts used in XRD and TEM lab trainingBased on the author’s course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics.It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering.

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  • Correlative Light and Electron Microscopy V : Volume 187
    Correlative Light and Electron Microscopy V : Volume 187

    Correlative Light and Electron Microscopy V, Volume 187 in the Methods in Cell Biology series, highlights advances in the field, with this new volume presenting interesting chapters on timely topics, including Orthotopic brain tumor models derived from glioblastoma stem-like cells, RNA sequencing in hematopoietic stem cells, Generation of inducible pluripotent stem cells from human dermal fibroblasts, In vitro preparation of dental pulp stem cell grafts combined with biocompatible scaffolds for tissue engineering, Gene expression knockdown in chronic myeloid leukemia stem cells, Identification and isolation of slow-cycling GSCs, Assessment of CD133, EpCAM, and much more.

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  • How is electron microscopy stained?

    Electron microscopy uses heavy metal stains to enhance contrast and visibility of the specimen. These stains include uranyl acetate and lead citrate, which are applied to the specimen after it has been fixed and dehydrated. The heavy metal stains interact with the electrons in the microscope, creating contrast between different structures within the specimen. This allows for detailed imaging of the ultrastructure of cells and tissues at a very high resolution.

  • What are the advantages of cryo-electron microscopy?

    Cryo-electron microscopy (cryo-EM) offers several advantages over other imaging techniques. Firstly, it allows for the visualization of biological samples in their native state without the need for staining or fixing, providing more accurate structural information. Secondly, cryo-EM can achieve higher resolution images compared to traditional electron microscopy, making it a powerful tool for studying complex biological structures. Lastly, cryo-EM is a versatile technique that can be used to study a wide range of samples, from small molecules to large macromolecular complexes.

  • What are the advantages and disadvantages of electron microscopy?

    Electron microscopy offers several advantages, such as high resolution, allowing for the visualization of extremely small structures and details. It also provides a greater depth of field compared to light microscopy, enabling clearer imaging of three-dimensional structures. However, electron microscopy can be expensive to purchase and maintain, and the sample preparation process can be complex and time-consuming. Additionally, the high vacuum environment required for electron microscopy may limit the types of samples that can be studied.

  • What do the electron microscopy images of membrane trafficking look like?

    Electron microscopy images of membrane trafficking typically show intricate networks of membranes and vesicles within the cell. These images reveal the dynamic process of vesicle formation, transport, and fusion with target membranes. The high resolution of electron microscopy allows for detailed visualization of the different stages of membrane trafficking, providing valuable insights into the mechanisms underlying intracellular transport. Overall, these images provide a visual representation of the complex and highly regulated process of membrane trafficking within cells.

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  • In-Situ Transmission Electron Microscopy Experiments : Design and Practice
    In-Situ Transmission Electron Microscopy Experiments : Design and Practice

    In-Situ Transmission Electron Microscopy Experiments Design and execute cutting-edge experiments with transmission electron microscopy using this essential guide In-situ microscopy is a recently-discovered and rapidly-developing approach to transmission electron microscopy (TEM) that allows for the study of atomic and/or molecular changes and processes while they are in progress.Experimental specimens are subjected to stimuli that replicate near real-world conditions and their effects are observed at a previously unprecedented scale.Though in-situ microscopy is becoming an increasingly important approach to TEM, there are no current texts combining an up-to-date overview of this cutting-edge set of techniques with the experience of in-situ TEM professionals.In-Situ Transmission Electron Microscopy Experiments meets this need with a work that synthesizes the collective experience of myriad collaborators.It constitutes a comprehensive guide for planning and performing in-situ TEM measurements, incorporating both fundamental principles and novel techniques.Its combination of technical detail and practical how-to advice makes it an indispensable introduction to this area of research.In-Situ Transmission Electron Microscopy Experiments readers will also find: Coverage of the entire experimental process, from method selection to experiment design to measurement and data analysisDetailed treatment of multimodal and correlative microscopy, data processing and machine learning, and moreDiscussion of future challenges and opportunities facing this field of research In-Situ Transmission Electron Microscopy Experiments is essential for graduate students, post-doctoral fellows, and early career researchers entering the field of in-situ TEM.

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  • A Practical Guide to Scanning Electron Microscopy in the Biosciences
    A Practical Guide to Scanning Electron Microscopy in the Biosciences

    A concise and authoritative introduction to scanning electron microscopy in the biological sciences In A Practical Guide to Scanning Electron Microscopy distinguished electron microscopist Gerhard Wanner delivers a practical handbook for biological scientists working with microbial, plant, and animal cells and tissues, enabling them to successfully apply scanning electron microscopy (SEM) to their object of study.The book begins with an introduction to the principles of electron microscopy and the operation of electron microscopes before moving on to describe the preparation and mounting of specimens.It also explores the process of recoding images and their subsequent analysis, along with a wide range of advanced microscopy techniques, including cryo-SEM, FIB-SEM tomography, and stereo-SEM.Scanning Electron Microscopy in the Biosciences contains hundreds of carefully selected microscopic images, as well as hands-on, step-by-step guidance required to perform a successful TEM experiment.Readers will also find: Thorough introductions to optics, electron microscopy, electrons, and the components of electron microscopesIn-depth examinations of the preparation of biological specimens and specimen mounting for scanning electron microscopyA comparison of different SEM modes and their strengths and weaknessesAn introduction to novel techniques such as correlative light and electron microscopy (CLEM), array tomography, and cryo-scanning electron microscopy Perfect for cell biologists and microbiologists, A Practical Guide to Scanning Electron Microscopy in the Biosciences also belongs in the libraries of neurobiologists and biophysicists.

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  • Raman Scattering on Emerging Semiconductors and Oxides
    Raman Scattering on Emerging Semiconductors and Oxides

    Raman Scattering on Emerging Semiconductors and Oxides presents Raman scattering studies.It describes the key fundamental elements in applying Raman spectroscopies to various semiconductors and oxides without complicated and deep Raman theories. Across nine chapters, it covers:• SiC and IV-IV semiconductors,• III-GaN and nitride semiconductors,• III-V and II-VI semiconductors,• ZnO-based and GaO-based semiconducting oxides,• Graphene, ferroelectric oxides, and other emerging materials,• Wide-bandgap semiconductors of SiC, GaN, and ZnO, and• Ultra-wide gap semiconductors of AlN, Ga2O3, and graphene. Key achievements from the author and collaborators in the above fields are referred to and cited with typical Raman spectral graphs and analyses.Written for engineers, scientists, and academics, this comprehensive book will be fundamental for newcomers in Raman spectroscopy. Zhe Chuan Feng has had an impressive career spanning many years of important work in engineering and tech, including as a professor at the Graduate Institute of Photonics & Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei; establishing the Science Exploring Lab; joining Kennesaw State University as an adjunct professor, part-time; and at the Department of Electrical and Computer Engineering, Southern Polytechnic College of Engineering and Engineering Technology.Currently, he is focusing on materials research for LED, III-nitrides, SiC, ZnO, other semiconductors/oxides, and nanostructures and has devoted time to materials research and growth of III-V and II-VI compounds, LED, III nitrides, SiC, ZnO, GaO, and other semiconductors/oxides. Professor Feng has also edited and published multiple review books in his field, alongside authoring scientific journal papers and conference/proceeding papers.He has organized symposiums and been an invited speaker at different international conferences and universities.He has also served as a guest editor for special journal issues.

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  • Andonstar Digital Microscope 500x 8LED USB Microscope Video Camera Magnifier HD Electron Microscopy
    Andonstar Digital Microscope 500x 8LED USB Microscope Video Camera Magnifier HD Electron Microscopy

    Andonstar Digital Microscope 500x 8LED USB Microscope Video Camera Magnifier HD Electron Microscopy

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  • What is a unbound electron and a free electron pair?

    An unbound electron is an electron that is not associated with an atom or molecule, meaning it is free to move independently. A free electron pair refers to a pair of unbound electrons that are not part of a chemical bond and are free to move around. These free electrons play a crucial role in various physical and chemical processes, such as conductivity in metals and chemical reactions.

  • What is an unbound electron and a free electron pair?

    An unbound electron is an electron that is not associated with an atom or molecule, meaning it is free to move independently. A free electron pair refers to two electrons that are not involved in bonding with other atoms, allowing them to move freely within a material. Both unbound electrons and free electron pairs play important roles in various physical and chemical processes, such as conducting electricity in metals or participating in chemical reactions.

  • When does electron absorption occur and when does electron emission occur?

    Electron absorption occurs when an electron gains energy and moves to a higher energy level within an atom or molecule. This can happen when the electron absorbs a photon of light or heat energy. On the other hand, electron emission occurs when an electron loses energy and moves to a lower energy level, releasing a photon of light or heat energy in the process. This can happen when an electron is excited to a higher energy level and then returns to its original energy level.

  • What state do particles obtain through electron uptake and electron release?

    Particles obtain a charged state through electron uptake and electron release. When a particle gains an electron, it becomes negatively charged, and when it loses an electron, it becomes positively charged. This process of gaining or losing electrons is known as ionization, and it results in the formation of ions with a net positive or negative charge.

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